久久久久无码精品,四川省少妇一级毛片,老老熟妇xxxxhd,人妻无码少妇一区二区

質(zhì)量工程師英文自薦信

時(shí)間:2017-04-01 求職信 我要投稿

   Brief Bio:

Born on Aug. 21, 1979, in Jiaxing, Zhejiang Province

Graduate from Department of Physics, ******** University of Shanghai (1997-2001) as Bachelor

Associate engineer in Product Reliability Engineering in******Shanghai

Engineer in Process Reliability Development in ******* Beijing, 2004-2005

Quality engineer in ********, since Sep. 2005

Experience:

Part I -- Management

Set up ********* both in Shanghai (2001) and Beijing (2004) for ******:

-- evaluate equipments of process and product reliability tests

-- plan layout and coordinate facility system

Manager of the ********  Shanghai (2001-2004), in charge of:

-- spare parts

-- human resource

-- PM and calibration, etc.

Coordinator and internal auditor of ISO9001, ISO14001 and OHSAS18001,

CCAR and inline MRB chairman for 4 customers of Amkor China (CABGA, PBGA and FCPGA)

Internal quality project owner of:

-- Customer audit analysis

-- Automation system

-- Factory moving qualification, etc.

In a short summary:

Various experiences in quality system, customer audit, task force teamwork, and management of resources.

Experience:

Part II -- Technology

Owner of package related product reliability tests (2001-2004), including pre-conditioning, TC, TS, THB, HAST, PCT, etc.

Owner of wafer level process reliability tests (2004-2005), including:

-- Dielectric related: TDDB, Vramp, Jramp, constant-J and P2ID

-- Device related: HCI and NBTI

-- Interconnection related: Isothermal, SWEAT and Iramp

In a short summary:

Comprehensive in reliability, parametric and functional tests, from the failure mechanism to the test methodology.

Skills:

Implant PDCA and teamwork into everyday work

Fluent in both written and spoken English, and acknowledged outstanding in expression and communication

Familiar with UNIX system, as well as C and BASIC programming

Familiar with Excel macro programming for data analysis

Familiar with statistical concept and tools, good at DOE and analysis by JMP